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    PIEZOELECTRIC CERAMIC, CERAMIC ELECTRONIC COMPONENT, AND PRODUCTION METHOD FOR PIEZOELECTRIC CERAMIC

    Neue Suche nach: KANAMORI YUKI

    A piezoelectric ceramic containing a perovskite-type compound containing at least Pb, Zr, Ti, Mn, and Nb, in which in an X-ray crystal structure analysis chart of the perovskite-type compound, there is no X-ray diffraction peak branching between a (101) plane on which an X-ray diffraction peak, which is a main peak of a PZT tetra phase, is detected in a range of 2θ = 30.5° or more, 31.5° or less and a (110) plane on which an X-ray diffraction peak is detected in a range of 2θ = 30.8° or more, 31.8° or less, and a number of X-ray diffraction peaks appearing based on the (101) plane and the (110) plane is one.

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    PIEZOELECTRIC CERAMIC, CERAMIC ELECTRONIC COMPONENT, AND PRODUCTION METHOD FOR PIEZOELECTRIC CERAMIC

    Neue Suche nach: KANAMORI YUKI

    A piezoelectric ceramic containing a perovskite-type compound containing at least Pb, Zr, Ti, Mn, and Nb, in which in an X-ray crystal structure analysis chart of the perovskite-type compound, there is no X-ray diffraction peak branching between a (101) plane on which an X-ray diffraction peak, which is a main peak of a PZT tetra phase, is detected in a range of 2θ = 30.5° or more, 31.5° or less and a (110) plane on which an X-ray diffraction peak is detected in a range of 2θ = 30.8° or more, 31.8° or less, and a number of X-ray diffraction peaks appearing based on the (101) plane and the (110) plane is one.

    Zugriff

    Download

    PIEZOELECTRIC CERAMIC, CERAMIC ELECTRONIC COMPONENT, AND PRODUCTION METHOD FOR PIEZOELECTRIC CERAMIC

    Neue Suche nach: KANAMORI YUKI

    A piezoelectric ceramic containing a perovskite-type compound containing at least Pb, Zr, Ti, Mn, and Nb, in which in an X-ray crystal structure analysis chart of the perovskite-type compound, there is no X-ray diffraction peak branching between a (101) plane on which an X-ray diffraction peak, which is a main peak of a PZT tetra phase, is detected in a range of 2θ = 30.5° or more, 31.5° or less and a (110) plane on which an X-ray diffraction peak is detected in a range of 2θ = 30.8° or more, 31.8° or less, and a number of X-ray diffraction peaks appearing based on the (101) plane and the (110) plane is one.

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    Titel:

    PIEZOELECTRIC CERAMIC, CERAMIC ELECTRONIC COMPONENT, AND PRODUCTION METHOD FOR PIEZOELECTRIC CERAMIC

    Weitere Titelangaben:

    PIEZOELEKTRISCHE KERAMIK, KERAMISCHES ELEKTRONISCHES BAUELEMENT UND HERSTELLUNGSVERFAHREN FÜR PIEZOELEKTRISCHE KERAMIK
    CÉRAMIQUE PIÉZOÉLECTRIQUE, COMPOSANT ÉLECTRONIQUE CÉRAMIQUE, ET PROCÉDÉ DE PRODUCTION DE CÉRAMIQUE PIÉZOÉLECTRIQUE

    Beteiligte:

    KANAMORI YUKI (Autor:in)

    Erscheinungsdatum:

    22.12.2021

    Medientyp:

    Patent

    Format:

    Elektronische Ressource

    Sprache:

    Englisch

    Klassifikation:

    IPC:  C04B Kalk , LIME / C01G Verbindungen der von den Unterklassen C01D oder C01F nicht umfassten Metalle , COMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F / H10N

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