Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
A BIST Technique for Configurable Nanofabric Arrays
This work proposes a Built-in Self Test (BIST) approach to test crossbars for a defined set of faults. The BIST can classify the different programmable elements in the crossbars as non-defective or defective with a certain fault type. The logic synthesis can then configure the crossbar by avoiding these defective elements.
A BIST Technique for Configurable Nanofabric Arrays
This work proposes a Built-in Self Test (BIST) approach to test crossbars for a defined set of faults. The BIST can classify the different programmable elements in the crossbars as non-defective or defective with a certain fault type. The logic synthesis can then configure the crossbar by avoiding these defective elements.
A BIST Technique for Configurable Nanofabric Arrays
Al-Assadi, Waleed K. (Autor:in) / Joshi, Mandar V. (Autor:in) / Chaudhry, Ghulam M. (Autor:in)
01.09.2008
239866 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
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