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Study of the scandate cathode properties from I-V characteristics
Scandate cathode is the most promising cathode type which can be utilized in THz devices. There is a wide transition region in the I-V characteristics of scandate cathode. The low slope and dual slope in the I-V characteristics according with Child-Langmuir law will be discussed in this paper.
Study of the scandate cathode properties from I-V characteristics
Scandate cathode is the most promising cathode type which can be utilized in THz devices. There is a wide transition region in the I-V characteristics of scandate cathode. The low slope and dual slope in the I-V characteristics according with Child-Langmuir law will be discussed in this paper.
Study of the scandate cathode properties from I-V characteristics
Shao, WenSheng (Autor:in) / Zhang, Ke (Autor:in) / Gao, YuJuan (Autor:in)
01.06.2014
292965 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
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