Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Use of a Microscope as a Noncontacting Microdisplacement Measurement Device
It is shown that a common research microscope with vertical illuminator can be easily converted to a noncontacting measuring device of submicroinch resolution. (Author)
Use of a Microscope as a Noncontacting Microdisplacement Measurement Device
It is shown that a common research microscope with vertical illuminator can be easily converted to a noncontacting measuring device of submicroinch resolution. (Author)
Use of a Microscope as a Noncontacting Microdisplacement Measurement Device
J. A. Simpson (Autor:in)
1971
3 pages
Report
Keine Angabe
Englisch
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