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X-ray microtomography: Application to microstructure analysis of a cementitious material during leaching process

Burlion, Nicolas

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X-ray microtomography: Application to microstructure analysis of a cementitious material during leaching process

Burlion, Nicolas

X-ray microtomography: Application to microstructure analysis of a cementitious material during leaching process

Burlion, Nicolas

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

Seitennavigation

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Titel:

X-ray microtomography: Application to microstructure analysis of a cementitious material during leaching process

Beteiligte:

Burlion, Nicolas (Autor:in) / Bernard, Dominique / Chen, Da

Erschienen in:

Cement and concrete research ; 36

Erscheinungsdatum:

2006

ISSN:

0008-8846

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Schlagwörter:

Zement , Zeitschrift , Beton

Klassifikation:

Lokalklassifikation TIB: 770/6530
BKL: 58.45 / 56.45 Baustoffkunde / 58.45 Gesteinshüttenkunde / 56.45

Burlion, N. / Bernard, D. / Chen, D. | British Library Online Contents | 2006

X-ray microtomography: Application to microstructure analysis of a cementitious material during leaching process

Burlion, Nicolas / Bernard, Dominique / Chen, Da | Tema Archiv | 2006

Application of synchrotron microtomography for pore structure characterization of deteriorated cementitious materials due to leaching

Sugiyama, T. / Promentilla, M. A. / Hitomi, T. et al. | British Library Online Contents | 2010

Application of synchrotron microtomography for pore structure characterization of deteriorated cementitious materials due to leaching

Sugiyama, T. | Online Contents | 2010

Application of synchrotron microtomography for pore structure characterization of deteriorated cementitious materials due to leaching

Sugiyama, T. / Promentilla, M.A.B. / Hitomi, T. et al. | British Library Conference Proceedings | 2010

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