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Subsurface Geology - Inversion of Subsurface Properties of Layered Dielectric Structures With Random Slightly Rough Interfaces Using the Method of Simulated Annealing
Subsurface Geology - Inversion of Subsurface Properties of Layered Dielectric Structures With Random Slightly Rough Interfaces Using the Method of Simulated Annealing
Subsurface Geology - Inversion of Subsurface Properties of Layered Dielectric Structures With Random Slightly Rough Interfaces Using the Method of Simulated Annealing
Tabatabaeenejad, A. (Autor:in) / Moghaddam, M.
2009
Aufsatz (Zeitschrift)
Unbekannt
Lokalklassifikation TIB:
770/3710/5670
BKL:
74.41
/
38.03
Methoden und Techniken der Geowissenschaften
/
74.41
Luftaufnahmen, Photogrammetrie
/
38.03
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