Spatial—temporal marked point processes: a spectrum of stochastic models

Renshaw, Eric | Wiley | 2010

Partial characteristics for marked spatial point processes

Eckardt, M. / Mateu, J. | Wiley | 2019

Spatial threshold exceedance analysis through marked point processes

Madrid, A.E. / Angulo, J.M. / Mateu, J. | Wiley | 2012

Spatial threshold exceedance analysis through marked point processes

Madrid, A.E. / Angulo, J.M. / Mateu, J. | Wiley | 2012

A geometric stochastic approach based on marked point processes for road mark detection from high resolution aerial images

Tournaire, O. | Online Contents | 2009