Influence of Surface Roughness Measurement Scale on Radar Backscattering in Different Agricultural Soils: Fid-Bau Portal

Influence of Surface Roughness Measurement Scale on Radar Backscattering in Different Agricultural Soils

Martinez-Agirre, Alex

Soil surface roughness strongly affects the scattering of microwaves on the soil surface and determines the backscattering coefficient ( \sigma ^{0}) observed by radar sensors. Previous studies have shown important scale issues that compromise the measurement and parameterization of roughness especially in agricultural soils. The objective of this paper was to determine the roughness scales involved in the backscattering process over agricultural soils. With this aim, a database of 132 5-m profiles taken on agricultural soils with different tillage conditions was used. These measurements were acquired coinciding with a series of ENVISAT/ASAR observations. Roughness profiles were processed considering three different scaling issues: 1) influence of measurement range; 2) influence of low-frequency roughness components; and 3) influence of high-frequency roughness components. For each of these issues, eight different roughness parameters were computed and the following aspects were evaluated: 1) roughness parameters values; 2) correlation with \sigma ^{0} ; and 3) goodness-of-fit of the Oh model. Most parameters had a significant correlation with \sigma ^{0} especially the fractal dimension, the peak frequency, and the initial slope of the autocorrelation function. These parameters had higher correlations than classical parameters such as the standard deviation of surface heights or the correlation length. Very small differences were observed when longer than 1-m profiles were used as well as when small-scale roughness components (<5 cm) or large-scale roughness components (>100 cm) were disregarded. In conclusion, the medium-frequency roughness components (scale of 5-100 cm) seem to be the most influential scales in the radar backscattering process on agricultural soils.