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X-Ray Photoelectron Spectroscopy

Kibel, M. H.

Abstract The detection and energy analysis of photoelectrons produced by radiation whose energy exceeds their binding energies is the subject of an extensively-used technique known as photoelectron (PE) spectroscopy. This technique can be conveniently divided into two broad areas, the first employing ultraviolet radiation, hence called ultraviolet photoelectron spectroscopy (UPS), and the second using X-rays, termed X-ray photoelectron spectroscopy (XPS). The latter spectroscopy is the subject of this present chapter, while UPS is discussed in Chap. 14.

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X-Ray Photoelectron Spectroscopy

Kibel, M. H.

Abstract The detection and energy analysis of photoelectrons produced by radiation whose energy exceeds their binding energies is the subject of an extensively-used technique known as photoelectron (PE) spectroscopy. This technique can be conveniently divided into two broad areas, the first employing ultraviolet radiation, hence called ultraviolet photoelectron spectroscopy (UPS), and the second using X-rays, termed X-ray photoelectron spectroscopy (XPS). The latter spectroscopy is the subject of this present chapter, while UPS is discussed in Chap. 14.

X-Ray Photoelectron Spectroscopy

Kibel, M. H.

Abstract The detection and energy analysis of photoelectrons produced by radiation whose energy exceeds their binding energies is the subject of an extensively-used technique known as photoelectron (PE) spectroscopy. This technique can be conveniently divided into two broad areas, the first employing ultraviolet radiation, hence called ultraviolet photoelectron spectroscopy (UPS), and the second using X-rays, termed X-ray photoelectron spectroscopy (XPS). The latter spectroscopy is the subject of this present chapter, while UPS is discussed in Chap. 14.

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Titel:

X-Ray Photoelectron Spectroscopy

Beteiligte:

Kibel, M. H. (Autor:in)

Erschienen in:

Surface Analysis Methods in Materials Science ; 165-186

Springer Series in Surface Sciences ; 23

Erscheinungsdatum:

01.01.1992

Format / Umfang:

22 pages

ISBN:

978-3-662-02769-1 , 978-3-662-02767-7

ISSN:

DOI:

https://doi.org/10.1007/978-3-662-02767-7_7

Medientyp:

Aufsatz/Kapitel (Buch)

Format:

Elektronische Ressource

Sprache:

Englisch

Schlagwörter:

Auger Electron , Ultraviolet Photoelectron Spectroscopy , Auger Line , Channel Electron Multiplier , Auger Parameter Physics , Surface and Interface Science, Thin Films , Surfaces and Interfaces, Thin Films

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