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Engineered Grain Boundary Junctions — Characteristics, Structure, Applications

Alarco, J. / Boikov, Yu. / Brorsson, G. / Claeson, T. / Daalmans, G. / Edstam, J. / Ivanov, Z. / Kaplunenko, V. K. / Nilsson, P-Å. / Olsson, E. / ... [mehr]

Abstract The Josephson junctions using high Tc superconductors are presently, to a large extent, based upon grain boundary junctions. We discuss examples of such from our own experience: bi-crystal, bi-epitaxial, and step type junctions. Their electrical transport properties and structure are reviewed. The junction technology is sufficiently advanced to allow the development of electronic devices.

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Engineered Grain Boundary Junctions — Characteristics, Structure, Applications

Alarco, J. / Boikov, Yu. / Brorsson, G. / Claeson, T. / Daalmans, G. / Edstam, J. / Ivanov, Z. / Kaplunenko, V. K. / Nilsson, P-Å. / Olsson, E. / ... [mehr]

Abstract The Josephson junctions using high Tc superconductors are presently, to a large extent, based upon grain boundary junctions. We discuss examples of such from our own experience: bi-crystal, bi-epitaxial, and step type junctions. Their electrical transport properties and structure are reviewed. The junction technology is sufficiently advanced to allow the development of electronic devices.

Engineered Grain Boundary Junctions — Characteristics, Structure, Applications

Alarco, J. / Boikov, Yu. / Brorsson, G. / Claeson, T. / Daalmans, G. / Edstam, J. / Ivanov, Z. / Kaplunenko, V. K. / Nilsson, P-Å. / Olsson, E. / ... [mehr]

Abstract The Josephson junctions using high Tc superconductors are presently, to a large extent, based upon grain boundary junctions. We discuss examples of such from our own experience: bi-crystal, bi-epitaxial, and step type junctions. Their electrical transport properties and structure are reviewed. The junction technology is sufficiently advanced to allow the development of electronic devices.

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Titel:

Engineered Grain Boundary Junctions — Characteristics, Structure, Applications

Beteiligte:

Alarco, J. (Autor:in) / Boikov, Yu. (Autor:in) / Brorsson, G. (Autor:in) / Claeson, T. (Autor:in) / Daalmans, G. (Autor:in) / Edstam, J. (Autor:in) / Ivanov, Z. (Autor:in) / Kaplunenko, V. K. (Autor:in) / Nilsson, P-Å. (Autor:in) / Olsson, E. (Autor:in)

Erschienen in:

Materials and Crystallographic Aspects of HTc-Superconductivity ; 471-490

NATO ASI Series ; 263

Erscheinungsdatum:

01.01.1994

Format / Umfang:

20 pages

ISBN:

978-94-010-4463-9 , 978-94-011-1064-8

ISSN:

DOI:

https://doi.org/10.1007/978-94-011-1064-8_23

Medientyp:

Aufsatz/Kapitel (Buch)

Format:

Elektronische Ressource

Sprache:

Englisch

Schlagwörter:

Critical Current Density , Josephson Junction , Tunnel Junction , YBCO Film , Coulomb Blockade Engineering , Electronics and Microelectronics, Instrumentation , Characterization and Evaluation of Materials , Crystallography , Condensed Matter Physics

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