Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Artifacts in SPM
Abstract In this chapter, artifacts of scanning probe microscopy are discussed. The tip artifact, where the sample topography is convoluted with the tip geometry, is the most common artifact. A second class of artifacts are topography images, which are influenced by local variations in properties such as conductance, elasticity, adhesion or friction. The third class of artifacts are local measurements, such as SNOM, STM-induced photoemission or lateral force measurements, which are influenced by local topography. The fourth class of artifacts are instrumental artifacts.
Artifacts in SPM
Abstract In this chapter, artifacts of scanning probe microscopy are discussed. The tip artifact, where the sample topography is convoluted with the tip geometry, is the most common artifact. A second class of artifacts are topography images, which are influenced by local variations in properties such as conductance, elasticity, adhesion or friction. The third class of artifacts are local measurements, such as SNOM, STM-induced photoemission or lateral force measurements, which are influenced by local topography. The fourth class of artifacts are instrumental artifacts.
Artifacts in SPM
Professor Dr. Meyer, Ernst (Autor:in) / Professor Dr. Hug, Hans Josef (Autor:in) / Dr. Bennewitz, Roland (Autor:in)
01.01.2004
19 pages
Aufsatz/Kapitel (Buch)
Elektronische Ressource
Englisch
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