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Physicochemical Characterization of Passive Films and Corrosion Layers by Differential Admittance and Photocurrent Spectroscopy
The stabilization of metallic surfaces against corrosion processes in natural and industrial environment rests on the onset of passivity condition with a subsequent drastic reduction of the corrosion rate of the underlying metallic substrate. In spite of a longstanding controversy it is now universally accepted that a passive metal is usually covered by a thin or thick external layer the whose physicochemical properties control the evolution of corrosion process as well as the possible reactions occurring at metal/oxide and oxide/electrolyte interfaces.1,2 In many cases of practical importance, passivity of metals is reached in presence of very thin (few nm thick) layer which makes the complete physico-chemical characterization a very complex task requiring the use of different powerful in situ and/or ex situ techniques. This is particularly true if we want to get information pertaining to the chemical composition, morphology, crystalline or disordered nature and solid-state properties of the passive layers.
Many useful information on the film composition can be gathered from ex situ techniques (Auger, ESCA, XPS, SIMS, RBS, GDOES) although they suffer some limitations and drawback specially when investigating very thin films, owing to the risk of changing structure and composition of the passive film on going from the potentiostatic control in solution to the vacuum. According to this a large agreement exists on the advantages of passive film characterization based on in situ techniques or controlled transfer under inert atmosphere on going from electrochemical cell to analytical equipment.3–11
Physicochemical Characterization of Passive Films and Corrosion Layers by Differential Admittance and Photocurrent Spectroscopy
The stabilization of metallic surfaces against corrosion processes in natural and industrial environment rests on the onset of passivity condition with a subsequent drastic reduction of the corrosion rate of the underlying metallic substrate. In spite of a longstanding controversy it is now universally accepted that a passive metal is usually covered by a thin or thick external layer the whose physicochemical properties control the evolution of corrosion process as well as the possible reactions occurring at metal/oxide and oxide/electrolyte interfaces.1,2 In many cases of practical importance, passivity of metals is reached in presence of very thin (few nm thick) layer which makes the complete physico-chemical characterization a very complex task requiring the use of different powerful in situ and/or ex situ techniques. This is particularly true if we want to get information pertaining to the chemical composition, morphology, crystalline or disordered nature and solid-state properties of the passive layers.
Many useful information on the film composition can be gathered from ex situ techniques (Auger, ESCA, XPS, SIMS, RBS, GDOES) although they suffer some limitations and drawback specially when investigating very thin films, owing to the risk of changing structure and composition of the passive film on going from the potentiostatic control in solution to the vacuum. According to this a large agreement exists on the advantages of passive film characterization based on in situ techniques or controlled transfer under inert atmosphere on going from electrochemical cell to analytical equipment.3–11
Physicochemical Characterization of Passive Films and Corrosion Layers by Differential Admittance and Photocurrent Spectroscopy
Modern Aspects Electrochem.
Pyun, Su-Il (Herausgeber:in) / Lee, Jong-Won (Herausgeber:in) / Quarto, Francesco Di (Autor:in) / Mantia, Fabio La (Autor:in) / Santamaria, Monica (Autor:in)
05.08.2009
86 pages
Aufsatz/Kapitel (Buch)
Elektronische Ressource
Englisch
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