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Structural Determination of Surfaces and Overlayers with Diffraction Methods

Rieder, K. H.

Abstract A brief introduction to the newer developments of surface structural research using diffraction methods is given. Selected examples of results for clean unreconstructed and reconstructed surfaces,as well as on adsorbate overlayers and thin films,are presented to illustrate the current possibilities of the different methods discussed and the various research areas in which they are applied.

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Structural Determination of Surfaces and Overlayers with Diffraction Methods

Rieder, K. H.

Abstract A brief introduction to the newer developments of surface structural research using diffraction methods is given. Selected examples of results for clean unreconstructed and reconstructed surfaces,as well as on adsorbate overlayers and thin films,are presented to illustrate the current possibilities of the different methods discussed and the various research areas in which they are applied.

Structural Determination of Surfaces and Overlayers with Diffraction Methods

Rieder, K. H.

Abstract A brief introduction to the newer developments of surface structural research using diffraction methods is given. Selected examples of results for clean unreconstructed and reconstructed surfaces,as well as on adsorbate overlayers and thin films,are presented to illustrate the current possibilities of the different methods discussed and the various research areas in which they are applied.

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Bestellung bei Subito €

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Dokumentinformationen

Titel:

Structural Determination of Surfaces and Overlayers with Diffraction Methods

Beteiligte:

Rieder, K. H. (Autor:in)

Erschienen in:

Dynamical Phenomena at Surfaces, Interfaces and Superlattices ; 2-13

Springer Series in Surface Sciences ; 3

Erscheinungsdatum:

01.01.1985

Format / Umfang:

12 pages

ISBN:

978-3-642-82537-8 , 978-3-642-82535-4

ISSN:

DOI:

https://doi.org/10.1007/978-3-642-82535-4_1

Medientyp:

Aufsatz/Kapitel (Buch)

Format:

Elektronische Ressource

Sprache:

Englisch

Schlagwörter:

American Physical Society , RHEED Pattern , Repulsive Part , Surface Unit Cell , Ewald Sphere Physics , Surface and Interface Science, Thin Films , Surfaces and Interfaces, Thin Films

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