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X-Ray Diffraction and Mössbauer Effect Measurements near a Valence Transition

Jhans, H. / Croft, M. / Kemly, E. / Grier, B. / Segre, C. U.

Abstract EuPd2Si2 manifests the largest most rapid temperature induced valence change of any Eu compound.1,2 Transport, magnetic and lattice measurements all show strong anomalies in the 50 K interval centered on the continuous transition temperature of about 150K.

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X-Ray Diffraction and Mössbauer Effect Measurements near a Valence Transition

Jhans, H. / Croft, M. / Kemly, E. / Grier, B. / Segre, C. U.

Abstract EuPd2Si2 manifests the largest most rapid temperature induced valence change of any Eu compound.1,2 Transport, magnetic and lattice measurements all show strong anomalies in the 50 K interval centered on the continuous transition temperature of about 150K.

X-Ray Diffraction and Mössbauer Effect Measurements near a Valence Transition

Jhans, H. / Croft, M. / Kemly, E. / Grier, B. / Segre, C. U.

Abstract EuPd2Si2 manifests the largest most rapid temperature induced valence change of any Eu compound.1,2 Transport, magnetic and lattice measurements all show strong anomalies in the 50 K interval centered on the continuous transition temperature of about 150K.

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Titel:

X-Ray Diffraction and Mössbauer Effect Measurements near a Valence Transition

Beteiligte:

Jhans, H. (Autor:in) / Croft, M. (Autor:in) / Kemly, E. (Autor:in) / Grier, B. (Autor:in) / Segre, C. U. (Autor:in)

Erschienen in:

Theoretical and Experimental Aspects of Valence Fluctuations and Heavy Fermions ; 655-658

Erscheinungsdatum:

01.01.1987

Format / Umfang:

4 pages

ISBN:

978-1-4612-8259-4 , 978-1-4613-0947-5

DOI:

https://doi.org/10.1007/978-1-4613-0947-5_113

Medientyp:

Aufsatz/Kapitel (Buch)

Format:

Elektronische Ressource

Sprache:

Englisch

Schlagwörter:

Physics , Optics and Electrodynamics , Characterization and Evaluation of Materials

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