Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Second Layer Displacements in the Clean Reconstructed W(100) Surface
Abstract X-ray diffraction is gaining acceptance in the surface science community as a method for determination of surface structure. Its biggest strength is that it is a kinematical diffraction technique, unlike Leed or atom scattering, so that intensity information may be interpreted by simple wave superposition methods, such as Fourier transformation. The field of x-ray crystallography has developed many powerful methods for finding the positions of atoms in crystals. The main disadvantage, intimately related to the kinematical approximation, is that the cross section of a monolayer is in the range 10 D to 10, so intense sources of x-rays must be used. Diffraction from the bulk can also cause background problems, but not in the study of reconstructed surfaces, where fractional-order reflections arise only from the surface layer(s), and can always be separated. Some surface structures determined recently with x-rays are InSbO 11) 2x2 [1] and Au(IIO) 1x2 [2].
Second Layer Displacements in the Clean Reconstructed W(100) Surface
Abstract X-ray diffraction is gaining acceptance in the surface science community as a method for determination of surface structure. Its biggest strength is that it is a kinematical diffraction technique, unlike Leed or atom scattering, so that intensity information may be interpreted by simple wave superposition methods, such as Fourier transformation. The field of x-ray crystallography has developed many powerful methods for finding the positions of atoms in crystals. The main disadvantage, intimately related to the kinematical approximation, is that the cross section of a monolayer is in the range 10 D to 10, so intense sources of x-rays must be used. Diffraction from the bulk can also cause background problems, but not in the study of reconstructed surfaces, where fractional-order reflections arise only from the surface layer(s), and can always be separated. Some surface structures determined recently with x-rays are InSbO 11) 2x2 [1] and Au(IIO) 1x2 [2].
Second Layer Displacements in the Clean Reconstructed W(100) Surface
Robinson, I. K. (Autor:in) / Altman, M. S. (Autor:in) / Estrup, P. J. (Autor:in)
01.01.1988
5 pages
Aufsatz/Kapitel (Buch)
Elektronische Ressource
Englisch
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