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Surface Structure Analysis by Scanning LEED Microscopy

Ichinokawa, T. / Ishikawa, Y. / Hosokawa, Y. / Hamaguchi, J. / Kirschner, J.

Abstract The use of Low Energy Electron Diffraction (LEED) has so far been limited to the study of relatively large single crystal surfaces. Here we discuss how LEED can be utilized as a microanalytical tool which has a wide range of application to “real world” samples. A few of the capabilities of Scanning LEED Microscopy are demonstrated with the following examples: the step structure of the clean Si(111) surface, the domain structure of the reconstructed Si(110)16×2 surface and surface imperfections of GaAs(100) single crystal.

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Surface Structure Analysis by Scanning LEED Microscopy

Ichinokawa, T. / Ishikawa, Y. / Hosokawa, Y. / Hamaguchi, J. / Kirschner, J.

Abstract The use of Low Energy Electron Diffraction (LEED) has so far been limited to the study of relatively large single crystal surfaces. Here we discuss how LEED can be utilized as a microanalytical tool which has a wide range of application to “real world” samples. A few of the capabilities of Scanning LEED Microscopy are demonstrated with the following examples: the step structure of the clean Si(111) surface, the domain structure of the reconstructed Si(110)16×2 surface and surface imperfections of GaAs(100) single crystal.

Surface Structure Analysis by Scanning LEED Microscopy

Ichinokawa, T. / Ishikawa, Y. / Hosokawa, Y. / Hamaguchi, J. / Kirschner, J.

Abstract The use of Low Energy Electron Diffraction (LEED) has so far been limited to the study of relatively large single crystal surfaces. Here we discuss how LEED can be utilized as a microanalytical tool which has a wide range of application to “real world” samples. A few of the capabilities of Scanning LEED Microscopy are demonstrated with the following examples: the step structure of the clean Si(111) surface, the domain structure of the reconstructed Si(110)16×2 surface and surface imperfections of GaAs(100) single crystal.

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Titel:

Surface Structure Analysis by Scanning LEED Microscopy

Beteiligte:

Ichinokawa, T. (Autor:in) / Ishikawa, Y. (Autor:in) / Hosokawa, Y. (Autor:in) / Hamaguchi, J. (Autor:in) / Kirschner, J. (Autor:in)

Erschienen in:

The Structure of Surfaces II ; 58-64

Springer Series in Surface Sciences ; 11

Erscheinungsdatum:

01.01.1988

Format / Umfang:

7 pages

ISBN:

978-3-642-73345-1 , 978-3-642-73343-7

ISSN:

DOI:

https://doi.org/10.1007/978-3-642-73343-7_11

Medientyp:

Aufsatz/Kapitel (Buch)

Format:

Elektronische Ressource

Sprache:

Englisch

Schlagwörter:

Dark Field Image , Primary Beam , Diffract Beam , Secondary Electron Image , Field Emission Cathode Physics , Surface and Interface Science, Thin Films , Surfaces and Interfaces, Thin Films , Crystallography

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