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Surface Plasmon Emission as a Probe of Hot-Electron Dynamics

Kirtley, J. R. / Theis, T. N. / DiMaria, D. J. / Tsang, J. C. / Fischetti, M. V. / Brorson, S. D.

Abstract Surface plasmon mediated light emission from rough metal films can be driven in a number of different ways. They all show characteristic features independent of the driving mechanism. The unifying feature is that each mechanism injects hot electrons into the metal. We describe surface plasmon mediated emission from tunnel junctions in terms of a hot-electron picture. We show how this emission can be used as a spectroscopic probe of hot electron dynamics in tunnel junctions. We then describe how we used this tool to probe hot electron processes in electron injector structures, leading to important new insights into electron heating in SiO2.

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Surface Plasmon Emission as a Probe of Hot-Electron Dynamics

Kirtley, J. R. / Theis, T. N. / DiMaria, D. J. / Tsang, J. C. / Fischetti, M. V. / Brorson, S. D.

Abstract Surface plasmon mediated light emission from rough metal films can be driven in a number of different ways. They all show characteristic features independent of the driving mechanism. The unifying feature is that each mechanism injects hot electrons into the metal. We describe surface plasmon mediated emission from tunnel junctions in terms of a hot-electron picture. We show how this emission can be used as a spectroscopic probe of hot electron dynamics in tunnel junctions. We then describe how we used this tool to probe hot electron processes in electron injector structures, leading to important new insights into electron heating in SiO2.

Surface Plasmon Emission as a Probe of Hot-Electron Dynamics

Kirtley, J. R. / Theis, T. N. / DiMaria, D. J. / Tsang, J. C. / Fischetti, M. V. / Brorson, S. D.

Abstract Surface plasmon mediated light emission from rough metal films can be driven in a number of different ways. They all show characteristic features independent of the driving mechanism. The unifying feature is that each mechanism injects hot electrons into the metal. We describe surface plasmon mediated emission from tunnel junctions in terms of a hot-electron picture. We show how this emission can be used as a spectroscopic probe of hot electron dynamics in tunnel junctions. We then describe how we used this tool to probe hot electron processes in electron injector structures, leading to important new insights into electron heating in SiO2.

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Titel:

Surface Plasmon Emission as a Probe of Hot-Electron Dynamics

Beteiligte:

Kirtley, J. R. (Autor:in) / Theis, T. N. (Autor:in) / DiMaria, D. J. (Autor:in) / Tsang, J. C. (Autor:in) / Fischetti, M. V. (Autor:in) / Brorson, S. D. (Autor:in)

Erschienen in:

Dynamical Phenomena at Surfaces, Interfaces and Superlattices ; 276-290

Springer Series in Surface Sciences ; 3

Erscheinungsdatum:

01.01.1985

Format / Umfang:

15 pages

ISBN:

978-3-642-82537-8 , 978-3-642-82535-4

ISSN:

DOI:

https://doi.org/10.1007/978-3-642-82535-4_27

Medientyp:

Aufsatz/Kapitel (Buch)

Format:

Elektronische Ressource

Sprache:

Englisch

Schlagwörter:

Dispersion Curve , Tunnel Junction , Bias Voltage Versus , Carrier Separation , Grating Amplitude Physics , Surface and Interface Science, Thin Films , Surfaces and Interfaces, Thin Films

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