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Monte Carlo simulation of electron-solid interactions in cement-based materials
Knowledge of the size of the electron-solid interaction volume and the sampling volume of various signals within it is important for interpretation of images and analytical results obtained from electron microscopy. In this study we used a Monte Carlo technique to simulate electron trajectories in order to investigate the shape and size of the interaction volume, the spatial and energy distribution of backscattered electrons and characteristic X-rays in cement-based materials. We found that the maximum penetration depth of the electron trajectories ranges from 0.75 to 1.5 my m at 10 keV and from 2.5 to 5.0 my m at 20 keV. For backscattered electrons, the maximum sampling depth is about 30% of the interaction volume depth and its lateral dimension is close to the interaction volume depth. The sampling volume size of characteristic X-rays is a substantial fraction of the interaction volume. For ettringite, the amount of material analysed in X-ray microanalysis is in the order of 1 to 100 my m3 at conventional SEM accelerating voltages of 10 to 20 keV.
Monte Carlo simulation of electron-solid interactions in cement-based materials
Knowledge of the size of the electron-solid interaction volume and the sampling volume of various signals within it is important for interpretation of images and analytical results obtained from electron microscopy. In this study we used a Monte Carlo technique to simulate electron trajectories in order to investigate the shape and size of the interaction volume, the spatial and energy distribution of backscattered electrons and characteristic X-rays in cement-based materials. We found that the maximum penetration depth of the electron trajectories ranges from 0.75 to 1.5 my m at 10 keV and from 2.5 to 5.0 my m at 20 keV. For backscattered electrons, the maximum sampling depth is about 30% of the interaction volume depth and its lateral dimension is close to the interaction volume depth. The sampling volume size of characteristic X-rays is a substantial fraction of the interaction volume. For ettringite, the amount of material analysed in X-ray microanalysis is in the order of 1 to 100 my m3 at conventional SEM accelerating voltages of 10 to 20 keV.
Monte Carlo simulation of electron-solid interactions in cement-based materials
Wong, H.S. (Autor:in) / Buenfeld, N.R. (Autor:in)
Cement and Concrete Research ; 36 ; 1076-1082
2006
7 Seiten, 26 Quellen
Aufsatz (Zeitschrift)
Englisch
Monte Carlo simulation of electron-solid interactions in cement-based materials
| British Library Online Contents | 2006
Monte Carlo simulation of electron-solid interactions in cement-based materials
| Online Contents | 2006
| British Library Online Contents | 2016
| British Library Online Contents | 2016