Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Image intensity matching technique: application to the environmental scanning electron microscope
An image analysis technique, called image intensity matching, is developed and is shown to be suitable for studying the complex sub-pixel deformation on ESEM images. The technique is general but it is applied here to dimensional changes that occur as cement paste shrinks. The technique is based on a minimum mean square error criterion. The relationship between the present technique and the maximum cross correlation method is analyzed mathematically, and the latter is shown to be a special case in the minimum mean square error criterion. Noise is removed by a normalization process. The optimal window size is analyzed. The deformation parameters (for the problem in two dimensions) of rigid body translation, expansion or shrinkage, shear, and rotation in a deformed image can be determined. The resolution is calibrated using a simulated image shift and is shown to be about 0.2 pixel.
Image intensity matching technique: application to the environmental scanning electron microscope
An image analysis technique, called image intensity matching, is developed and is shown to be suitable for studying the complex sub-pixel deformation on ESEM images. The technique is general but it is applied here to dimensional changes that occur as cement paste shrinks. The technique is based on a minimum mean square error criterion. The relationship between the present technique and the maximum cross correlation method is analyzed mathematically, and the latter is shown to be a special case in the minimum mean square error criterion. Noise is removed by a normalization process. The optimal window size is analyzed. The deformation parameters (for the problem in two dimensions) of rigid body translation, expansion or shrinkage, shear, and rotation in a deformed image can be determined. The resolution is calibrated using a simulated image shift and is shown to be about 0.2 pixel.
Image intensity matching technique: application to the environmental scanning electron microscope
Bildintensitäts-Anpaßverfahren: Anwendung im Rasterelektronenmikroskop
Xi, Yunping (Autor:in) / Bergstrom, T.B. (Autor:in) / Jennings, H.M. (Autor:in)
Computational Materials Science ; 2 ; 249-260
1994
12 Seiten, 25 Quellen
Aufsatz (Zeitschrift)
Englisch
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