Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Field Emission Scanning Electron Microscopy : New Perspectives for Materials Characterization
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
Field Emission Scanning Electron Microscopy : New Perspectives for Materials Characterization
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
Field Emission Scanning Electron Microscopy : New Perspectives for Materials Characterization
Brodusch, Nicolas (Autor:in) / Demers, Hendrix (Autor:in) / Gauvin, Raynald (Autor:in)
2018
Online-Ressource (XII, 137 p. 53 illus., 20 illus. in color, online resource)
Buch
Elektronische Ressource
Englisch
DDC:
620.11
Field Emission Microscopy - Trends and Perspectives
| Springer Verlag | 1986
Scanning electron microscopy maps out materials
British Library Online Contents | 2008
| British Library Online Contents | 2009
Theory of electron tunneling in scanning tunneling microscopy and field ion microscopy
| British Library Online Contents | 1994