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X-ray diffraction analysis of some single crystals with special properties [2809-10]

Antipin, M. Y. / SPIE

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X-ray diffraction analysis of some single crystals with special properties [2809-10]

Antipin, M. Y. / SPIE

X-ray diffraction analysis of some single crystals with special properties [2809-10]

Antipin, M. Y. / SPIE

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

X-ray diffraction analysis of some single crystals with special properties [2809-10]

Contributors:

Antipin, M. Y. (author) / Ramachandran, N. / SPIE

Conference:

Conference, Space processing of materials ; 1996 ; Denver; CO

Published in:

Space processing of materials ; 88-91

PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING

Publication date:

1996-01-01

Size:

4 pages

ISBN:

0819421979

ISSN:

0361-0748

Type of media:

Conference paper

Type of material:

Language:

English

Keywords:

SPIE , space processing , materials

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