A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Reliability concerns in high temperature electronic systems (invited)
Reliability concerns in high temperature electronic systems (invited)
Reliability concerns in high temperature electronic systems (invited)
McCluskey, P. (author) / Grzybowski, R. R. (author) / Condra, L. (author) / Das, D. (author) / Golecki, I. / Engineering Foundation
High-temperature electronic materials, devices and sensors conference ; 1998 ; San Diego; CA
1998-01-01
8 pages
IEEE cat no 98EX132
Conference paper
English
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Materials selection issues for high operating temperature (HOT) electronic packaging (invited)
| British Library Conference Proceedings | 1998
High-temperature contact metallization to semiconductors (invited)
| British Library Conference Proceedings | 1998
Recent advances in high temperature, high frequency SiC devices (invited)
| British Library Conference Proceedings | 1998
Reliability Methods for Stability of Existing Slopes (Invited Paper)
| British Library Conference Proceedings | 1996
| British Library Conference Proceedings | 1992