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    Dilatometric and electrical resistivity measurements in various phases of Nitinol

    New search for: Uchil, J.
    New search for: Mohanchandra, K. P.
    New search for: Mahesh, K. K.
    New search for: Kumara, K. G.
    New search for: Wuttig, M.
    New search for: SPIE

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    Dilatometric and electrical resistivity measurements in various phases of Nitinol

    New search for: Uchil, J.
    New search for: Mohanchandra, K. P.
    New search for: Mahesh, K. K.
    New search for: Kumara, K. G.
    New search for: Wuttig, M.
    New search for: SPIE

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Dilatometric and electrical resistivity measurements in various phases of Nitinol

    New search for: Uchil, J.
    New search for: Mohanchandra, K. P.
    New search for: Mahesh, K. K.
    New search for: Kumara, K. G.
    New search for: Wuttig, M.
    New search for: SPIE

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    Dilatometric and electrical resistivity measurements in various phases of Nitinol

    Contributors:

    Uchil, J. (author) / Mohanchandra, K. P. (author) / Mahesh, K. K. (author) / Kumara, K. G. (author) / Wuttig, M. / SPIE

    Conference:

    Conference, Smart materials technologies ; 1999 ; Newport Beach; CA

    Published in:

    Smart materials technologies ; 321-329

    PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING

    Publication date:

    1999-01-01

    Size:

    9 pages

    Remarks:

    Held as part of smart structures and materials 1999

    ISBN:

    0819431494

    ISSN:

    0277-786X

    Type of media:

    Conference paper

    Type of material:

    Print

    Language:

    English

    Keywords:

    smart materials technologies , SPIE , materials technologies

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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