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Assessment of sensitivity advances in near-field Raman spectroscopy [4098-40]

Michaels, C. A. / Dentinger, C. E. J. / Richter, L. J. / Chase, D. B. / Cavanagh, R. R. / Stranick, S. J. / SPIE - International Society for Optical Engineering

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Assessment of sensitivity advances in near-field Raman spectroscopy [4098-40]

Michaels, C. A. / Dentinger, C. E. J. / Richter, L. J. / Chase, D. B. / Cavanagh, R. R. / Stranick, S. J. / SPIE - International Society for Optical Engineering

Assessment of sensitivity advances in near-field Raman spectroscopy [4098-40]

Michaels, C. A. / Dentinger, C. E. J. / Richter, L. J. / Chase, D. B. / Cavanagh, R. R. / Stranick, S. J. / SPIE - International Society for Optical Engineering

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Title:

Assessment of sensitivity advances in near-field Raman spectroscopy [4098-40]

Contributors:

Michaels, C. A. (author) / Dentinger, C. E. J. (author) / Richter, L. J. (author) / Chase, D. B. (author) / Cavanagh, R. R. (author) / Stranick, S. J. (author) / Andrews, D. L. / SPIE - International Society for Optical Engineering

Conference:

Conference, Optical devices and diagnostics in materials science ; 2000 ; San Diego, CA

Published in:

Optical devices and diagnostics in materials science ; 152-159

PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 4098

Publication date:

2000-01-01

Size:

8 pages

ISBN:

ISSN:

Type of media:

Conference paper

Type of material:

Print

Language:

English

Keywords:

optical devices , SPIE , materials science , optical engineering

© Metadata Copyright the British Library Board and other contributors. All rights reserved.

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