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    Reliability evaluation of monolithic integrated circuits

    New search for: Bajenescu, T. I.
    New search for: Bazu, M. I.
    New search for: Corotis, R. B.
    New search for: Schueller, G. I.
    New search for: Shinozuka, M.

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    Reliability evaluation of monolithic integrated circuits

    New search for: Bajenescu, T. I.
    New search for: Bazu, M. I.
    New search for: Corotis, R. B.
    New search for: Schueller, G. I.
    New search for: Shinozuka, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Reliability evaluation of monolithic integrated circuits

    New search for: Bajenescu, T. I.
    New search for: Bazu, M. I.
    New search for: Corotis, R. B.
    New search for: Schueller, G. I.
    New search for: Shinozuka, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Reliability evaluation of monolithic integrated circuits

    Contributors:

    Bajenescu, T. I. (author) / Bazu, M. I. (author) / Corotis, R. B. / Schueller, G. I. / Shinozuka, M.

    Conference:

    International conference; 8th, Structural safety and reliability; ICOSSAR '01 ; 2001 ; Newport Beach, CA

    Published in:

    Structural safety and reliability; ICOSSAR '01 ; 23

    STRUCTURAL SAFETY AND RELIABILITY -INTERNATIONAL CONFERENCE-

    Publication date:

    2001-01-01

    Size:

    23 pages

    Remarks:

    See also s/m 8478.550 vol 24 no 2-4 2002 for selected papers

    ISBN:

    905809197X

    Type of media:

    Conference paper

    Type of material:

    Print

    Language:

    English

    Keywords:

    ICOSSAR , structural safety

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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