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    Analysis and representation of BSDF and BRDF measurements [5192-19]

    New search for: Thomas, M. E.
    New search for: Blodgett, D. W.
    New search for: Hahn, D. V.
    New search for: Hanssen, Leonard M
    New search for: SPIE

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    Analysis and representation of BSDF and BRDF measurements [5192-19]

    New search for: Thomas, M. E.
    New search for: Blodgett, D. W.
    New search for: Hahn, D. V.
    New search for: Hanssen, Leonard M
    New search for: SPIE

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Analysis and representation of BSDF and BRDF measurements [5192-19]

    New search for: Thomas, M. E.
    New search for: Blodgett, D. W.
    New search for: Hahn, D. V.
    New search for: Hanssen, Leonard M
    New search for: SPIE

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Document information
    Title:

    Analysis and representation of BSDF and BRDF measurements [5192-19]

    Contributors:

    Thomas, M. E. (author) / Blodgett, D. W. (author) / Hahn, D. V. (author) / Hanssen, Leonard M / SPIE

    Conference:

    Conference; 3rd, Optical diagnostic methods for inorganic materials III

    Published in:

    Optical diagnostic methods for inorganic materials III ; 158-167

    PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 5192

    Publication date:

    2003-01-01

    Size:

    10 pages

    ISBN:

    0819450650

    ISSN:

    0277-786X

    Type of media:

    Conference paper

    Type of material:

    Print

    Language:

    English

    Keywords:

    optical diagnostic methods , inorganic materials , SPIE

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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