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Line-scan-based digit image description method and its application in fruit quality inspection [5587-09]
Line-scan-based digit image description method and its application in fruit quality inspection [5587-09]
Line-scan-based digit image description method and its application in fruit quality inspection [5587-09]
Rao, X. (author) / Ying, Y. (author) / Chen, Yud-Ren / Tu, Shu-I / SPIE-- the International Society for Optical Engineering
Conference, Nondestructive sensing for food safety, quality and natural resources ; 2004 ; Philadelphia, PA
2004-01-01
8 pages
Conference paper
English
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