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High energy x-ray refraction system to characterize inner surfaces or interfaces in materials [5767-51]
High energy x-ray refraction system to characterize inner surfaces or interfaces in materials [5767-51]
High energy x-ray refraction system to characterize inner surfaces or interfaces in materials [5767-51]
Ding, X. (author) / Gray, J. N. (author) / Jensen, T. C. (author) / Shull, Peter J. / Gyekenyesi, Andrew L. / Mufti, Aftab A. / Society of Photo-optical Instrumentation Engineers
Conference; 4th, Nondestructive evaluation and Health monitoring of aerospace materials, composites, and civil infrastructure IV ; 2005 ; San Diego, CA
2005-01-01
8 pages
Conference paper
English
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