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Characterization of Asphalt Materials Using X-Ray High-Resolution Computed Tomography Imaging Techniques

Gopalakrishnan, K. / Ceylan, H. / Inanc, F. / Gray, J. / Heitzman, M. / Transportation & Development Institute (American Society of Civil Engineers)

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Characterization of Asphalt Materials Using X-Ray High-Resolution Computed Tomography Imaging Techniques

Gopalakrishnan, K. / Ceylan, H. / Inanc, F. / Gray, J. / Heitzman, M. / Transportation & Development Institute (American Society of Civil Engineers)

Characterization of Asphalt Materials Using X-Ray High-Resolution Computed Tomography Imaging Techniques

Gopalakrishnan, K. / Ceylan, H. / Inanc, F. / Gray, J. / Heitzman, M. / Transportation & Development Institute (American Society of Civil Engineers)

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Title:

Characterization of Asphalt Materials Using X-Ray High-Resolution Computed Tomography Imaging Techniques

Contributors:

Gopalakrishnan, K. (author) / Ceylan, H. (author) / Inanc, F. (author) / Gray, J. (author) / Heitzman, M. (author) / Al-Qadi, I. L. / Transportation & Development Institute (American Society of Civil Engineers)

Conference:

Airfield and highway pavement specialty conference; MEETING TODAY'S CHALLENGES WITH EMERGING TECHNOLOGIES ; 2006 ; Atlanta, GA

Published in:

Airfield and highway pavement specialty conference; MEETING TODAY'S CHALLENGES WITH EMERGING TECHNOLOGIES ; 437-454

PROCEEDINGS OF THE AIRFIELD AND HIGHWAY PAVEMENT SPECIALITY CONFERENCE

Publication date:

2006-01-01

Size:

18 pages

ISBN:

0784408386

Type of media:

Conference paper

Type of material:

Language:

English

Keywords:

Runways (Aeronautics) , Express highways , Pavements , Airfield pavements , Highway pavements , Emerging technologies

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