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    Analysis of Stress Intensity Factors of a Planar Rectangular Interfacial Crack in Three Dimensional Bimaterials

    New search for: Noda, N.A.
    New search for: Xu, C.H.
    New search for: Zhou, Yu
    New search for: Tu, Shan-Tung
    New search for: Xie, Xishan

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    Analysis of Stress Intensity Factors of a Planar Rectangular Interfacial Crack in Three Dimensional Bimaterials

    New search for: Noda, N.A.
    New search for: Xu, C.H.
    New search for: Zhou, Yu
    New search for: Tu, Shan-Tung
    New search for: Xie, Xishan

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Analysis of Stress Intensity Factors of a Planar Rectangular Interfacial Crack in Three Dimensional Bimaterials

    New search for: Noda, N.A.
    New search for: Xu, C.H.
    New search for: Zhou, Yu
    New search for: Tu, Shan-Tung
    New search for: Xie, Xishan

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    Analysis of Stress Intensity Factors of a Planar Rectangular Interfacial Crack in Three Dimensional Bimaterials

    Contributors:

    Noda, N.A. (author) / Xu, C.H. (author) / Zhou, Yu / Tu, Shan-Tung / Xie, Xishan

    Conference:

    Progresses in fracture and strength of materials and structures; Fracture and Strength 2006; APCFS'06 ; 2006 ; Sanya, China

    Published in:

    Progresses in fracture and strength of materials and structures; Fracture and Strength 2006; APCFS'06 ; 2449-2454

    KEY ENGINEERING MATERIALS ; 353/358

    Publication date:

    2007-01-01

    Size:

    6 pages

    Remarks:

    Includes bibliographic references and index.

    ISSN:

    1013-9826

    Type of media:

    Conference paper

    Type of material:

    Print

    Language:

    English

    Keywords:

    Fracture mechanics , Strength of materials , Structures , APCFS

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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