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    Comparison of Test Pile Profiles with Simulated Low-Strain Integrity Test Data

    New search for: Beim, Jorge W.
    New search for: De Rosa, Reynaldo L.
    New search for: Mantovani, Felipe

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    Comparison of Test Pile Profiles with Simulated Low-Strain Integrity Test Data

    New search for: Beim, Jorge W.
    New search for: De Rosa, Reynaldo L.
    New search for: Mantovani, Felipe

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Comparison of Test Pile Profiles with Simulated Low-Strain Integrity Test Data

    New search for: Beim, Jorge W.
    New search for: De Rosa, Reynaldo L.
    New search for: Mantovani, Felipe

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Comparison of Test Pile Profiles with Simulated Low-Strain Integrity Test Data

    Contributors:

    Beim, Jorge W. (author) / De Rosa, Reynaldo L. (author) / Albuquerque, Paulo J. R. (author) / Mantovani, Felipe (author)

    Conference:

    10th Stress wave theory and testing methods for deep foundations International conference

    Published in:

    10th Stress wave theory and testing methods for deep foundations International conference ; 159-168

    ASTM special technical publication ; 1611

    Publication date:

    2019-01-01

    Size:

    10 pages

    ISSN:

    0066-0558

    Type of media:

    Conference paper

    Type of material:

    Print

    Language:

    English

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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