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Nonlinear recombinations in photoreflectance characterization of silicon wafers

Forget, B. C. / Fournier, D. / Gusev, V. E.

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Nonlinear recombinations in photoreflectance characterization of silicon wafers

Forget, B. C. / Fournier, D. / Gusev, V. E.

Nonlinear recombinations in photoreflectance characterization of silicon wafers

Forget, B. C. / Fournier, D. / Gusev, V. E.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Nonlinear recombinations in photoreflectance characterization of silicon wafers

Contributors:

Forget, B. C. (author) / Fournier, D. (author) / Gusev, V. E. (author)

Published in:

APPLIED SURFACE SCIENCE ; 63 ; 255

Publication date:

1993-01-01

Size:

255 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 621.35

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