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    Characterization of Near Surface Layers by Means of Total Reflection X-Ray Fluorescence Spectrometry

    New search for: Schwenke, H.
    New search for: Gutschke, R.
    New search for: Knoth, J.

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    Characterization of Near Surface Layers by Means of Total Reflection X-Ray Fluorescence Spectrometry

    New search for: Schwenke, H.
    New search for: Gutschke, R.
    New search for: Knoth, J.

    Access

    Access via TIB
    Check availability in my library
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    Characterization of Near Surface Layers by Means of Total Reflection X-Ray Fluorescence Spectrometry

    New search for: Schwenke, H.
    New search for: Gutschke, R.
    New search for: Knoth, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    Characterization of Near Surface Layers by Means of Total Reflection X-Ray Fluorescence Spectrometry

    Contributors:

    Schwenke, H. (author) / Gutschke, R. (author) / Knoth, J. (author)

    Published in:

    ADVANCES IN X RAY ANALYSIS ; 941

    Publication date:

    1993-01-01

    Size:

    941 pages

    ISSN:

    0376-0308

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  539.7222

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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