Differential Hall-Effect Spectroscopy of Rare-Earth Impurities (Ce,Er) in Silicon: Fid-Bau Portal

Differential Hall-Effect Spectroscopy of Rare-Earth Impurities (Ce,Er) in Silicon

Nakayama, H. / Matsuura, A. / Kohno, M. / Nishino, T.

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Differential Hall-Effect Spectroscopy of Rare-Earth Impurities (Ce,Er) in Silicon

Nakayama, H. / Matsuura, A. / Kohno, M. / Nishino, T.

Differential Hall-Effect Spectroscopy of Rare-Earth Impurities (Ce,Er) in Silicon

Nakayama, H. / Matsuura, A. / Kohno, M. / Nishino, T.

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Order at Subito €

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Document information

Title:

Differential Hall-Effect Spectroscopy of Rare-Earth Impurities (Ce,Er) in Silicon

Contributors:

Nakayama, H. (author) / Matsuura, A. (author) / Kohno, M. (author) / Nishino, T. (author) / Taguchi, T.

Published in:

Shallow Impurities in Semiconductors ; 279

MATERIALS SCIENCE FORUM

Publication date:

1993-01-01

Size:

279 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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