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    Piezomodulated reflectivity on CdMnTe/CdTe quantum well structures as a new standard characterization method

    New search for: Kurtz, E.
    New search for: Schmitt, K.
    New search for: Hommel, D.
    New search for: Waag, A.

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    Piezomodulated reflectivity on CdMnTe/CdTe quantum well structures as a new standard characterization method

    New search for: Kurtz, E.
    New search for: Schmitt, K.
    New search for: Hommel, D.
    New search for: Waag, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Piezomodulated reflectivity on CdMnTe/CdTe quantum well structures as a new standard characterization method

    New search for: Kurtz, E.
    New search for: Schmitt, K.
    New search for: Hommel, D.
    New search for: Waag, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Piezomodulated reflectivity on CdMnTe/CdTe quantum well structures as a new standard characterization method

    Contributors:

    Kurtz, E. (author) / Schmitt, K. (author) / Hommel, D. (author) / Waag, A. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 16 ; 92

    Publication date:

    1993-01-01

    Size:

    92 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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