A platform for research: civil engineering, architecture and urbanism
Local Analysis of Internal Interfaces in Integrated Microcircuits by Auger Electron Spectroscopy
Local Analysis of Internal Interfaces in Integrated Microcircuits by Auger Electron Spectroscopy
Local Analysis of Internal Interfaces in Integrated Microcircuits by Auger Electron Spectroscopy
Troneva, M. A. (author) / Penskii, N. V. (author)
1992-01-01
727 pages
Article (Journal)
Unknown
DDC:
607.2
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Auger electron spectroscopy analysis of SiC-whisker surfaces and SiC-whisker/alumina interfaces
British Library Online Contents | 1995
|Auger electron spectroscopic analysis of chemical vapour deposited diamond/substrate interfaces
British Library Online Contents | 1994
|Auger Electron Spectroscopy (AES and SAM)
British Library Online Contents | 1992
|British Library Online Contents | 1997
|Auger electron spectroscopy study of MgB2 surface
British Library Online Contents | 2003
|