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Failure mechanism of chromium-silicon-oxide resistive films stressed by electric pulse loading

Sato, K. / Nagata, T. / Watanabe, M. / Nakayama, H.

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Failure mechanism of chromium-silicon-oxide resistive films stressed by electric pulse loading

Sato, K. / Nagata, T. / Watanabe, M. / Nakayama, H.

Failure mechanism of chromium-silicon-oxide resistive films stressed by electric pulse loading

Sato, K. / Nagata, T. / Watanabe, M. / Nakayama, H.

Access

Access via TIB

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Order at Subito €

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Document information

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Document information

Title:

Failure mechanism of chromium-silicon-oxide resistive films stressed by electric pulse loading

Contributors:

Sato, K. (author) / Nagata, T. (author) / Watanabe, M. (author) / Nakayama, H. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE ; 28 ; 2955

Publication date:

1993-01-01

Size:

2955 pages

ISSN:

0022-2461

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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