Scanning IR microscopy and transmission electron microscopy studies of inhomogeneities in LEC S-doped InP: Fid-Bau Portal

Scanning IR microscopy and transmission electron microscopy studies of inhomogeneities in LEC S-doped InP

Jin, N. Y. / Booker, G. R. / Grant, I. R.

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Scanning IR microscopy and transmission electron microscopy studies of inhomogeneities in LEC S-doped InP

Jin, N. Y. / Booker, G. R. / Grant, I. R.

Scanning IR microscopy and transmission electron microscopy studies of inhomogeneities in LEC S-doped InP

Jin, N. Y. / Booker, G. R. / Grant, I. R.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Scanning IR microscopy and transmission electron microscopy studies of inhomogeneities in LEC S-doped InP

Contributors:

Jin, N. Y. (author) / Booker, G. R. (author) / Grant, I. R. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 20 ; 94

Publication date:

1993-01-01

Size:

94 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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