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The electrical characterization of grain boundaries in ultra-fine grained Y-TZP

Chen, C. S. / Boutz, M. M. R. / Boukamp, B. A. / Winnubst, A. J. A.

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The electrical characterization of grain boundaries in ultra-fine grained Y-TZP

Chen, C. S. / Boutz, M. M. R. / Boukamp, B. A. / Winnubst, A. J. A.

The electrical characterization of grain boundaries in ultra-fine grained Y-TZP

Chen, C. S. / Boutz, M. M. R. / Boukamp, B. A. / Winnubst, A. J. A.

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Check availability in my library

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Document information

Title:

The electrical characterization of grain boundaries in ultra-fine grained Y-TZP

Contributors:

Chen, C. S. (author) / Boutz, M. M. R. (author) / Boukamp, B. A. (author) / Winnubst, A. J. A. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- A ; 168 ; 231

Publication date:

1993-01-01

Size:

231 pages

ISSN:

0921-5093

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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