A platform for research: civil engineering, architecture and urbanism
Diffraction effects in Auger quantitative analysis on III-V compounds
Diffraction effects in Auger quantitative analysis on III-V compounds
Diffraction effects in Auger quantitative analysis on III-V compounds
Valeri, S. (author) / Di Bona, A. (author) / Nava, E. (author)
APPLIED SURFACE SCIENCE ; 70/71 ; 20
1993-01-01
20 pages
Article (Journal)
Unknown
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Diffraction effects in Auger quantitative analysis on III-V compounds
British Library Online Contents | 1993
|Quantitative analysis of Auger lineshapes of oxidized iron
British Library Online Contents | 1994
|Quantitative Auger and XPS Analysis of Thin Films
British Library Online Contents | 1992
|Quantitative Auger electron spectroscopy analysis of the Au-Ni system
British Library Online Contents | 1993
|Auger and X-ray photoelectron diffraction in MgO(001)
British Library Online Contents | 1994
|