Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Dielectric Losses Taken into Account in Measurements of the Resistivity of Semiconductors by the Contactless HF Method

    New search for: Vlasov, V. N.
    New search for: Krupnyi, A. I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Dielectric Losses Taken into Account in Measurements of the Resistivity of Semiconductors by the Contactless HF Method

    New search for: Vlasov, V. N.
    New search for: Krupnyi, A. I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Dielectric Losses Taken into Account in Measurements of the Resistivity of Semiconductors by the Contactless HF Method

    New search for: Vlasov, V. N.
    New search for: Krupnyi, A. I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Dielectric Losses Taken into Account in Measurements of the Resistivity of Semiconductors by the Contactless HF Method

    Contributors:

    Vlasov, V. N. (author) / Krupnyi, A. I. (author)

    Published in:

    INDUSTRIAL LABORATORY C/C OF ZAVODSKAIA LABORATORIIA ; 59 ; 177

    Publication date:

    1993-01-01

    Size:

    177 pages

    ISSN:

    0019-8447

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  607.2

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Contactless Characterization of Semiconductors Using Laser-Induced Surface Photo-Charge Voltage Measurements

    Abbate, A. / Rencibia, P. / Ivanov, O. et al. | British Library Online Contents | 1995

    Contactless resistivity and photoconductivity correlation to surface preparation of CdZnTe

    Zázvorka, J. / Franc, J. / Moravec, P. et al. | British Library Online Contents | 2014

    Contactless mapping of mesoscopic resistivity variations in semi-insulating substrates

    Stibal, R. / Wickert, M. / Hiesinger, P. et al. | British Library Online Contents | 1999

    Stress Analysis of Fibrous Flywheels with Binder Taken into Account

    Mokeev, A. M. / Sidorin, S. G. | British Library Online Contents | 1992

    Contactless resistivity and photoconductivity correlation to surface preparation of CdZnTe

    Zazvorka, J. / Franc, J. / Moravec, P. et al. | British Library Online Contents | 2014

    Back to top