Phonon Spectroscopy of Defects Correlated with the Diffusion of Zn into Si: Fid-Bau Portal

Phonon Spectroscopy of Defects Correlated with the Diffusion of Zn into Si

Staiger, J. / Gross, P. / Lassmann, K. / Bracht, H.

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Phonon Spectroscopy of Defects Correlated with the Diffusion of Zn into Si

Staiger, J. / Gross, P. / Lassmann, K. / Bracht, H.

Phonon Spectroscopy of Defects Correlated with the Diffusion of Zn into Si

Staiger, J. / Gross, P. / Lassmann, K. / Bracht, H.

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Check availability in my library

Order at Subito €

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Document information

Title:

Phonon Spectroscopy of Defects Correlated with the Diffusion of Zn into Si

Contributors:

Staiger, J. (author) / Gross, P. (author) / Lassmann, K. (author) / Bracht, H. (author)

Published in:

MATERIALS SCIENCE FORUM ; 675

Publication date:

1994-01-01

Size:

675 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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