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    Micro-Scale and Nano-Scale Testing of Materials Using Scanned Probe Technologies

    New search for: Phelan, M.
    New search for: McDonnell, L.
    New search for: Cashell, E. M.
    New search for: Dalton, J. O.
    New search for: Hampshire, S.
    New search for: Buggy, M.
    New search for: Carr, A. J.

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    Micro-Scale and Nano-Scale Testing of Materials Using Scanned Probe Technologies

    New search for: Phelan, M.
    New search for: McDonnell, L.
    New search for: Cashell, E. M.
    New search for: Dalton, J. O.
    New search for: Hampshire, S.
    New search for: Buggy, M.
    New search for: Carr, A. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Micro-Scale and Nano-Scale Testing of Materials Using Scanned Probe Technologies

    New search for: Phelan, M.
    New search for: McDonnell, L.
    New search for: Cashell, E. M.
    New search for: Dalton, J. O.
    New search for: Hampshire, S.
    New search for: Buggy, M.
    New search for: Carr, A. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Micro-Scale and Nano-Scale Testing of Materials Using Scanned Probe Technologies

    Contributors:

    Phelan, M. (author) / McDonnell, L. (author) / Cashell, E. M. (author) / Dalton, J. O. (author) / Hampshire, S. / Buggy, M. / Carr, A. J.

    Published in:

    Proceedings of the 8th Irish Materials Forum Conference IMF8 University College, Dublin, September, 1992 ; 207

    KEY ENGINEERING MATERIALS

    Publication date:

    1993-01-01

    Size:

    207 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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