A platform for research: civil engineering, architecture and urbanism
Optimization of Ultrasonic Copper Electro-deposition in the Narrow Channels of Via-Hole in Integrated Circuits
Optimization of Ultrasonic Copper Electro-deposition in the Narrow Channels of Via-Hole in Integrated Circuits
Optimization of Ultrasonic Copper Electro-deposition in the Narrow Channels of Via-Hole in Integrated Circuits
Seryanov, Y. V. (author) / Kvyatkovskaya, L. M. (author) / Grishanin, V. A. (author)
1994-01-01
284 pages
Article (Journal)
Unknown
DDC:
669
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Ultrasonic Nickel Electrodeposition in the Channels of Narrow Holes in Integrated Circuits
British Library Online Contents | 1994
|British Library Online Contents | 1993
|IET Digital Library Archive | 1886
|Recyclable integrated slope narrow-opening hole repairing structure and application method
European Patent Office | 2024
|