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    Local Mechanical Properties in Thin Aluminium Layers on Silicon Substrates Calculated from Measured Grain Orientations

    New search for: Gerth, D.
    New search for: Schwarzer, R. A.

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    Local Mechanical Properties in Thin Aluminium Layers on Silicon Substrates Calculated from Measured Grain Orientations

    New search for: Gerth, D.
    New search for: Schwarzer, R. A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Local Mechanical Properties in Thin Aluminium Layers on Silicon Substrates Calculated from Measured Grain Orientations

    New search for: Gerth, D.
    New search for: Schwarzer, R. A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Document information
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    Document information
    Title:

    Local Mechanical Properties in Thin Aluminium Layers on Silicon Substrates Calculated from Measured Grain Orientations

    Contributors:

    Gerth, D. (author) / Schwarzer, R. A. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 1571

    Publication date:

    1994-01-01

    Size:

    1571 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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