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Growth and structural characterization of thin Ge films by molecular dynamics simulation

Spinelli, A. / Colombo, L.

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Growth and structural characterization of thin Ge films by molecular dynamics simulation

Spinelli, A. / Colombo, L.

Growth and structural characterization of thin Ge films by molecular dynamics simulation

Spinelli, A. / Colombo, L.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Growth and structural characterization of thin Ge films by molecular dynamics simulation

Contributors:

Spinelli, A. (author) / Colombo, L. (author) / Balkanski, M. / Kamimura, H. / Mahajan, S.

Published in:

Solid-State Materials for Advanced Technology ; 61

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 26

Publication date:

1994-01-01

Size:

61 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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