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    Application of ODF to the Rietveld Profile Refinement of Polycrystalline Solid

    New search for: Choi, C. S.
    New search for: Baker, E. F.
    New search for: Orosz, J.

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    Application of ODF to the Rietveld Profile Refinement of Polycrystalline Solid

    New search for: Choi, C. S.
    New search for: Baker, E. F.
    New search for: Orosz, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Application of ODF to the Rietveld Profile Refinement of Polycrystalline Solid

    New search for: Choi, C. S.
    New search for: Baker, E. F.
    New search for: Orosz, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Application of ODF to the Rietveld Profile Refinement of Polycrystalline Solid

    Contributors:

    Choi, C. S. (author) / Baker, E. F. (author) / Orosz, J. (author)

    Published in:

    ADVANCES IN X RAY ANALYSIS ; 49

    Publication date:

    1994-01-01

    Size:

    49 pages

    ISSN:

    0376-0308

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  539.7222

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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