A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
The Use of a Conventional Powder Diffractometer for Thin-Film Thickness Determination from Reflectivity Data
The Use of a Conventional Powder Diffractometer for Thin-Film Thickness Determination from Reflectivity Data
The Use of a Conventional Powder Diffractometer for Thin-Film Thickness Determination from Reflectivity Data
Huang, T. C. (author) / Gilles, R. (author) / Will, G. (author)
1994-01-01
183 pages
Article (Journal)
Unknown
DDC:
539.7222
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