Total Reflection X-Ray Fluorescence Spectroscopy: Analysis of GaAs and InGaAs: Fid-Bau Portal

Total Reflection X-Ray Fluorescence Spectroscopy: Analysis of GaAs and InGaAs

Files-Sesler, L. A. / Plumton, D. / Kao, Y.-C. / Kim, T. S.

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Total Reflection X-Ray Fluorescence Spectroscopy: Analysis of GaAs and InGaAs

Files-Sesler, L. A. / Plumton, D. / Kao, Y.-C. / Kim, T. S.

Total Reflection X-Ray Fluorescence Spectroscopy: Analysis of GaAs and InGaAs

Files-Sesler, L. A. / Plumton, D. / Kao, Y.-C. / Kim, T. S.

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Check availability in my library

Order at Subito €

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Document information

Title:

Total Reflection X-Ray Fluorescence Spectroscopy: Analysis of GaAs and InGaAs

Contributors:

Files-Sesler, L. A. (author) / Plumton, D. (author) / Kao, Y.-C. (author) / Kim, T. S. (author)

Published in:

ADVANCES IN X RAY ANALYSIS ; 585

Publication date:

1994-01-01

Size:

585 pages

ISSN:

0376-0308

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 539.7222

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