Topography and angular distribution of sputtered atoms of silver target bombarded by Si^-~n (n = 1,2) ions: Fid-Bau Portal

Topography and angular distribution of sputtered atoms of silver target bombarded by Si^-~n (n = 1,2) ions

Wang, Z. / Pan, J. / Zhang, J. / Tao, Z.

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Topography and angular distribution of sputtered atoms of silver target bombarded by Si^-~n (n = 1,2) ions

Wang, Z. / Pan, J. / Zhang, J. / Tao, Z.

Topography and angular distribution of sputtered atoms of silver target bombarded by Si^-~n (n = 1,2) ions

Wang, Z. / Pan, J. / Zhang, J. / Tao, Z.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Topography and angular distribution of sputtered atoms of silver target bombarded by Si^-~n (n = 1,2) ions

Contributors:

Wang, Z. (author) / Pan, J. (author) / Zhang, J. (author) / Tao, Z. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE LETTERS ; 14 ; 33

Publication date:

1995-01-01

Size:

33 pages

ISSN:

0261-8028

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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